Thermocompression bonding of copper leads to a metallized ceramic substrate
AssigneesAmerican Telephone and Telegraph Company, AT&T Technologies, Inc.
InventorsBenjamin H. Cranston, Richard L. Hunsberger, Donald A. Machusak
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Abstract
Copper leads having an average grain size from 0.035 to 0.055 mm are thermocompression bonded to a metallized portion of a ceramic substrate. Surprisingly, such large grain size substantially decreases the "ceramic pullout" of the bonded leads.
Claims5
An electronic device comprising:
- a ceramic substrate having metallized patterns thereon;
- a semiconductor chip bonded to first ends of the metallized patterns;
- and
- at least one unalloyed copper lead, having an average grain size from 0.035 to 0.055 mm, with a portion thereof thermocompressively bonded to a second end of the metallized pattern.
A cermic substrate having a semiconductor device bonded to first ends of a plurality of gold plated leads on said substrate and ends of unalloyed copper leads thermocompressively bonded to second ends of the gold plated leads, wherein the copper lead material has an average grain size from 0.035 to 0.055 mm which large grain size reduces ceramic pullout.
A method of bonding an unalloyed copper lead to a metallized area of a cermic substrate, comprising the step of:
- thermocompressively bonding a portion of the copper lead, which has an average grain size from 0.035 to 0.055 mm, to the metallized area of the ceramic substrate.
Dependencies are inferred from the claim text.