US 4,733,172 A · Apparatus for testing I.C. chip

Abstract

An improved test probe card for testing unpackaged integrated-circuit (IC) chips prior to installation of the chips in some type of electronic device. The test probe card includes a chip insulating board having openings at positions corresponding to contact areas of an IC chip and a test circuit board having inner contact areas at positions corresponding to the openings in the chip insulating board. Electrical connections between the IC chip and inner circuit board contact areas are established with conductive connector elements positioned in the openings. Circuit board traces electrically connect the inner circuit board contact areas with outer contact areas located about the periphery of the circuit board. The outer contact areas are preferably connected to a testing device using coaxial cables, which are electrically connected to the outer contact areas with a coaxial cable connecting board. The connector elements are preferably each formed from a single strand of metal wire, each strand being wadded together to form a nearly cylindrical "button" of material.

Claims15

Dependent claims

Apparatus for testing an IC chip, the IC chip having a plurality of contact areas, comprising:

a chip insulating board having a plurality of openings therethrough, with at least some of the openings at positions corresponding to the IC chip contact areas;
a test circuit board having inner contact areas at positions corresponding to some of the openings in the chip insulating board and a plurality of electrically-conductive traces on at least one side of the test circuit board electrically connecting the inner contact areas with a plurality of outer contact areas located about the periphery of the test circuit board;
a plurality of conductive connector elements disposed in selected ones of the openings in the chip insulating board for making electrical connections between the chip and inner contact areas;
and
means for electrically connecting the outer contact areas to a testing device.

2 more elements

Apparatus for testing an IC chip having a plurality of contact areas, comprising:

a chip insulating board having a plurality of openings therethrough, with at least some of the openings at positions corresponding to the IC chip contact areas;
a test circuit board having inner contact areas at positions corresponding to some of the openings in the chip insulating board and a plurality of electrically-conductive traces on at least one side of the test circuit board electrically connecting the inner contact areas with a plurality of outer contact areas located about the periphery of the test circuit board;
a plurality of conductive connector elements disposed in selected ones of the openings in the chip insulating board for making electrical connections between the chip and inner circuit board contact areas;
a coaxial cable insulating board having a plurality of openings therethrough, with at least some of the openings at positions corresponding to the outer contact areas;
a coaxial cable support frame for supporting coaxial cables at positions corresponding to some of the openings in the coaxial cable insulating board;
and
a plurality of conductive connector elements disposed in selected ones of the openings in the coaxial cable insulating board for making electrical connections between the outer contact areas and the ends of the coaxial cables.

4 more elements

Dependencies are inferred from the claim text.

Apparatus for testing I.C. chip

Life of this patent

Apparatus for testing I.C. chip

Life of this patent

Abstract

Claims15