Fast scan/set testable latch using two levels of series gating with two current sources
AssigneeSperry Corporation
InventorDale F. Berndt
Life of this patent
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AssigneeSperry Corporation
InventorDale F. Berndt
Estimating the term…
A circuit of 24 transistors and 16 resistors forming an interconnected constant current source, two differential current switches, and level shifter receives scan/set test data, clock, and enablement signals for, when connected to each of the set Q and clear Q output signals of a differential feedback latch, enabling scan/set testability of such latch. Both the latch and the connected circuit, forming in aggregate a scan/set testable latch, are implementable in Emitter Coupled Logic or current Mode Logic from standard cells of gate array technology using two levels of series gating and two current sources, which standard cells are otherwise useful for the generation of other logic macros. The differential feedback latch, experiencing but a small added capacitance from the connected circuit, continues to operate fast during normal operation, but is slow in operation for scan/set test wherein the connected circuit needs overcome differential feedback loops within the latch which are still active.
An addition improvement to the apparatus of feedback latch circuit employing two levels of series gating and one current source to the end that such latch circuit should be made scan/set testable responsively to received scan/set data, scan/set clock, and scan/set enablement signals, said improvement comprising:
Dependencies are inferred from the claim text.