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US 4,508,686 AGranted
Film strip for rapid test of a film processor
AssigneeProbeX Inc.
InventorsGary S. Shaber, Charles W. Buenzli, Jr.
Life of this patent
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AssigneeProbeX Inc.
InventorsGary S. Shaber, Charles W. Buenzli, Jr.
Estimating the term…
Apparatus and test film strip for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area, the acceptable or too light threshold of a maximum density or dark area and the acceptable/too light and acceptable/too dark threshold of a medium density test area. Sequence testing of the graded density areas is functionally related on a single film strip to timing marks, adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.
A test film adapted for automatic testing of film processor function, said film having a lengthwise direction and including a plurality of test areas disposed at preselected locations along said lengthwise direction and preselected lengthwise test positions associated therewith, said film further including a lengthwise track comprising alternating signal and non-signal areas disposed at preselected lengthwise positions along said track, the length, position and spacing of said signal and non-signal areas being adapted to provide a continuous output signal indicative of the presence of said film in a reader therefor, counting signals indicative of the passage of said film lengthwise through a preselected number and sequence of positions relative to a reader therefor and to provide signals indicative of the relative locations of said test positions.
Dependencies are inferred from the claim text.