Interface assembly for testing integrated circuit devices

A system for establishing an accurate and reliable electrical connection between a test circuit and a plurality of connection pins of an integrated circuit device arrayed in at least one row, comprising

• a contactor assembly comprising,
• a base formed from an insulating material,
• a plurality of contacts arrayed in at least one row with a lower end of each contact secured to said base and an upper end adapted to make electrical connection with one of the pins, each of said contacts being flexible to move between a first position where said upper ends are spaced from said pins and a second position where said upper ends are in electrical connection with said pins, each of said contacts being adapted to conduct an electrical signal along its length to an associated pin of the device,
• plate means secured in a closely spaced, generally parallel relationship with said at least one row of contacts, the dimensions of said plate means and said spacing producing a distributed capacitive reactance in said contacts produced by the presence of said plate means generally offsets the inductive reactance produced by said signal in said contacts whereby said signals encounter a generally characteristic impedance over a broad band, and
• an interface assembly comprising:
• a contactor board with a pattern of conductive stripes carried on at least one face,
• at least one elongated elastomeric connector with mutually spaced conductive filaments oriented generally perpendicular to the longitudinal axis of said connector and carried on its outer surface, and
• means for securing said elastomeric connector, said contactor board and said contactor assembly in a fixed spatial relation with each other whereby said elastomeric connector establishes an electrical connection between a conductive stripe on the contactor board and one of said contact or plate means of said contactor assembly.