Column defect compensating apparatus for CCD image sensor

Column defect compensating apparatus for a charge coupled device (CCD) image sensor of the type having a two-dimensional array comprising rows and columns of charge transfer elements, and an output CCD shift register arranged across one end of the columns and adapted to receive in parallel, one row of charge packets and to deliver the charge packets serially under control of clock signals to an output location, the column defect compensating apparatus comprising:

• auxiliary CCD shift register means having a plurality of cells corresponding to the columns of the two-dimensional array for producing signals representing the condition of said columns;
• means for applying said clock signals to said auxiliary shift register means to produce said condition representative signals in synchronism with the delivery of the charge packets in the output shift register to the output location;
• programable input means for inserting, in parallel, into said auxiliary shift register, signals representing the condition of the columns of the array;
• said programable input means comprising (1) diode means disposed adjacent said cells of said auxiliary shift register for providing a source of signal charge, (2) gate means disposed between said diode means and said cells for selectively isolating said diode means from said cells, and (3) selectively destructible conductor means for controlling the transfer of charge from said diode means past said gate to said cells;
• and
• signal processing circuit means responsive to the signals the said auxiliary shift register for compensating for the column defects in the output of the image sensor.