Device for automatically measuring thickness of coatings on a substrate by comparison with an uncoated substrate
AssigneeNorbert Nix
InventorMaria Nix, born Saxler
Life of this patent
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Abstract
Instrument for measuring thickness of coatings on substrate based on space-dependent, electromagnetic interaction between a measuring probe resting against the coating and the substrate comprising a compensating probe, a comparison body with properties similar to that of the substrate, a mechanism for adjusting the spacing of the compensating probe from the comparison body, until the same electromagnetic interaction is obtained as for the measuring probe and the substrate and a device for displaying the spacing between the compensating probe and comparison body.
Claims11
A portable instrument for measuring the thicknesses of coatings on substrates based on a spacing-dependent, electro-magnetic characteristic of the substrate, comprising a housing enclosing:
- a measuring probe for resting against the coating and interacting with the substrate to measure the characteristic,
- a comparison body with the same electromagnetic characteristic as the substrate,
- a compensating probe for interacting with the comparison body to measure the characteristic of the comparison body,
- means for adjusting the spacing of the compensating probe from the comparison body until the same electromagnetic interaction is obtained as between the measuring probe and the substrate, and
- means for displaying the spacing between the compensating probe and comparison body, said means for adjusting including an automatic control circuit for adjusting the spacing between the comparison body and the compensating probe, and electric drive means operated by said automatic control circuit for displacing the comparison body, said means for displaying being operatively coupled to said electric drive means.
Dependencies are inferred from the claim text.