High sensitivity photon feedback photodetectors
AssigneeBell Telephone Laboratories, Incorporated
InventorJohn A. Copeland, III
Life of this patent
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Abstract
Large current gains and high degrees of sensitivity to impinging primary photons are realized in photon feedback photodetectors embodying the invention. A photocurrent generated by an internal photodiode (10, 11) in response to the primary photons (6) causes secondary photons to be emitted by internal serially connected luminescence diodes (12, 13; 14, 15). Secondary photons traveling away from the photodiode are redirected by a reflector (16) to impinge on the photodiode and thereby sustain the photocurrent. Gains of the order of 100 are realized by these photodetectors.
Claims8
An optoelectronic device comprising a substrate and at least four abutting layers of semiconductor material grouped into a sequence of pairs of layers, each pair being arranged as a first layer and a second layer, the substrate abutting one layer of the pairs of layers and being comprised of a semiconductor material having a similar conductivity type to that of the abutting layer of the pairs of layers,
- electrode means for applying a bias potential across the sequence of pairs of layers,
- the first layer of each pair being composed of semiconductor material having a conductivity type opposite to that of the second layer in the corresponding pair, the first and second layers within each pair having substantially equal bandgaps,
- the first layer of each pair in the sequence of pairs being comprised of similar conductivity type semiconductor material to the second layer of each immediately adjacent pair of layers, and the bandgap of the first layer of each pair being substantially dissimilar to the bandgap of the second layer of each immediately adjacent pair,
- characterized in that
- a reflective coating layer abuts an outermost layer of the sequence of pairs of layers.
An optoelectronic comprising a substrate and at least six abutting layers of semiconductor material grouped into a sequence of pairs of layers, each pair being arranged as a first layer and a second layer, the substrate abutting one layer of the pairs of layers and being comprised of a semiconductor material having a similar conductivity type to that of the abutting layer,
- electrode means for applying a bias potential across the sequence of pairs of layers,
- the first layer of each pair being composed of semiconductor material having a conductivity type opposite to that of the second layer in the corresponding pair, the first and second layers within each pair having substantially equal bandgaps,
- characterized in that
- the first layer of each pair in the sequence of pairs is composed of similar conductivity type semiconductor material to the second layer of each immediately adjacent pair of layers, and
- the bandgap of the first layer of each pair is substantially dissimilar to the bandgap of the second layer of each immediately adjacent pair.
Dependencies are inferred from the claim text.