Method for destructive testing of dielectric ceramic capacitors
AssigneeCentre Engineering, Inc.
InventorsSolomon Levinson, William Reilly
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Abstract
This invention covers a destructive testing procedure in which a voltage 2.5 times the rated voltage is applied to the capacitor, at a relatively high current. The resistance in series with capacitors being tested is reduced step-by-step until the resistance value is reached such that the percentage of capacitor failures on any given sample of capacitors remains constant. Thereafter, all similar capacitors are tested at that resistance value and at 2.5 times the rated voltage. Those which do not explode exhibit remarkable reliability.
Claims6
A method of testing ceramic dielectric capacitors comprising the steps of
- a. applying a voltage of 2.5 times the rated voltage of said capacitor to said capacitor through a variable resistance,
- b. varying the value of said resistance from 0 ohms to a nominally low ohmic value,
- c. testing a plurality of groups of similar capacitors at each resistance value and determining the failure rate at each of said resistance values,
- d. setting a test resistance value equal to that at which the failure rate is substantially level, and
- e. applying a voltage 2.5 times the rated voltage for each further capacitor being tested through a resistance having a value determined in accordance with step d.
Dependencies are inferred from the claim text.