Device for multisample infrared analysis of materials in microgram quantity
AssigneeRCA Corporation
InventorsPeter J. Zanzucchi, William R. Frenchu
Life of this patent
Estimating the term…
Abstract
A sampling device adapted for mounting on a conventional microsampling apparatus for infrared spectroscopy is arranged to sample a plurality of different samples of unknown material during one operation. The device supports by a clamp an IR-transparent substrate on which solutions of samples are deposited. After evaporation of the solvent, the residue of unknown material is analyzed by conventional spectroscopy procedures. Each of the plurality of such samples deposited on the substrate are manually rotated into and out of exposure to the IR beam of the apparatus for rapid analysis.
Claims8
In a microsampling apparatus for infrared (IR) spectroscopy of the type having means for providing an IR beam to indicate a sample of material, optical means for focusing said beam on said sample, and means for subsequently processing the IR beam to provide information representing the ingredients of the material, wherein the improvement comprises:
- a base plate mounted at the focal point of said beam and an aperture in said plate for passing said IR beam;
- and
- means attached to said base plate for supporting a moveable IR-transparent substrate;
- said substrate arranged to receive one or more samples of material at locations on said substrate moveable to an optical register position over said aperture to pass said beam.
Dependencies are inferred from the claim text.