Transmission electron microscope employing sequential pixel acquistion for display
AssigneeUniversity Patents, Inc.
InventorMircea Fotino
Life of this patent
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Abstract
A standard Transmission Electron Microscope is modified to include electrostatic deflection plates for deflecting the image of the specimen across an aperture plate. The electrons passing through the aperture plate are detected and converted into image pixels for either instantaneous display or for further conversion into digital form for subsequent storage of the image.
Claims6
In a transmission electron microscope including means for generating an electron beam of energy sufficient to illuminate but not substantially injure all or a substantial portion of a specimen to produce immediately below said specimen an instantaneous and complete image of said specimen or substantial portion thereof, the improvement comprising:
- aperture defining means;
- means for deflecting said complete image across said aperture defining means, at any instant said aperture defining a pixel of said image and;
- electron detector means for providing, during said instant, an output indicative of the number of electrons passing through said aperture defining means as said complete image is deflected thereacross to thereby produce non-interfering pixel representations.
Dependencies are inferred from the claim text.