System for measuring the wall thickness of an object
AssigneeB.V. Neratoom
InventorsWilhelmus M. J. Haesen, Gerardus M. Keltjens
Life of this patent
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AssigneeB.V. Neratoom
InventorsWilhelmus M. J. Haesen, Gerardus M. Keltjens
Estimating the term…
The wall thickness of an object is measured on the basis of three consecutive rear wall reflections caused by an ultrasonic wave impinging on the front wall of the object. The time intervals between, on the one hand, the first and second rear wall reflections and, on the other hand, the second and third rear wall reflections are compared. In the event of correspondence of these time intervals, a "good" signal indicative of a true thickness value is produced. The system is adapted for a highly accurate wall thickness measurement, with the feasibility of providing an indication of the percentage of "good" measurements in sequence thereof.
Apparatus for measuring wall thickness of an object by ultrasonic energy, the apparatus including a transducer for transmitting ultrasonic energy into a front wall of an object and receiving echo signals from the object, a transceiver coupled to the transducer for energizing the transducer to transmit periodic pulses of ultrasonic energy and for processing the echo signals received by the transducer to derive a signal indicative of the wall thickness of the object from a time interval between received echo signals, wherein the improvement comprises:
Dependencies are inferred from the claim text.