Optical cut-off filter
AssigneeSiemens Aktiengesellschaft
InventorHans F. Mahlein
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AssigneeSiemens Aktiengesellschaft
InventorHans F. Mahlein
Estimating the term…
An optical cut-off filter characterized by a multi-layer system comprising of a sequence of dielectric layers which are bordered on each side by a transparent medium having an equal or same index of refraction with the index of refraction of each of the dielectric layers being selected so that for a preselected radiation angle of incidence, the band paths of the filter have an envelope of reflected secondary maximum for a component vibrating perpendicular to the radiation plane of incidence and the envelope for a component vibrating parallel to the radiation of planar incidence of the electrical field vector of incident radiation, and both envelopes exhibit zero locations which have a different wavelength due to the selection of the index of refraction of the dielectric layers forming the filter.
In an optical cut-off filter in the form of a multilayer system comprising a sequence of dielectric layers A and B interposed between a transparent bordering medium having an index of refraction n.sub.0, and with an index of refraction n.sub.A for each of the layers A and an index of refraction n.sub.B for each of said layers B selected so that, for a preselected radiation angle of incidence .theta., the pass band of the filter has an envelope E.sub.s of the reflecting secondary maxima for the s-component vibrating perpendicular to the radiation plane of incidence and an envelope E.sub.p for the p-component vibrating parallel to the radiation plane of incidence of the electrical field vector of the incident radiation, and wherein each envelope has a zero location, the improvement comprising having the indices of refraction n.sub.A and n.sub.B of the dielectric layers A and B of the filter selected so that the zero locations of the two envelopes E.sub.s and E.sub.p lie at somewhat different wavelengths.
Dependencies are inferred from the claim text.