New photodetector array based optical measurement systems
AssigneeDiffracto Ltd.
InventorsNicholas Liptay-Wagner, Roland Renaud, Timothy R. Pryor, Donald A. Clarke
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AssigneeDiffracto Ltd.
InventorsNicholas Liptay-Wagner, Roland Renaud, Timothy R. Pryor, Donald A. Clarke
Estimating the term…
A method and apparatus are provided for analyzing the light pattern produced on a photodetector array. The signal produced by the array is filtered with a low pass filter and the output of the filter is differentiated to obtain either the first or second derivative of the filtered signal for one or more points in the pattern. The zero crossing of the differentiated signal is detected and the zero crossing point is timed relative to a further point, e.g., the start of the scan of the array, so as to obtain an output related to the position of the corresponding point or points in the pattern.
Method for analyzing a light pattern produced on a photo detector array, comprising the steps of:
A method according to 21 wherein said bars are a bar code on an object.
A method according to 21 wherein said bars are imaged through an object surface whose properties are determined.
A method according to 21 wherein said bars are projected onto a surface, said bars on said surface are imaged onto said photodetector array and contours of said surface are determined.
Apparatus for analyzing a light pattern produced on a photo detector array, comprising:
Dependencies are inferred from the claim text.