Scannable detector system for echelle grating spectrometers
AssigneeLeeman Labs Inc.
InventorsKarl J. Hildebrand, John Leeman
Life of this patent
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AssigneeLeeman Labs Inc.
InventorsKarl J. Hildebrand, John Leeman
Estimating the term…
A scannable detector system for echelle grating spectrometers is disclosed in which a photodetector is positioned behind an aperture plate having a plurality of apertures corresponding to focal positions of the spectral array eminating from the grating. The detector is arranged to scan from aperture to aperture to measure the presence of individual wavelengths in the array. Additionally, the detector may be removed from the field of the plate to permit the substitution of a non-scannable array of detectors and an associated masking aperture plate to simultaneously measure the presence of a plurality of wavelengths in the spectral array.
A scannable detector system for echelle grating spectrometric comprising in combination:
Dependencies are inferred from the claim text.