Method, apparatus and film strip of particular design for rapid test of a film processor
AssigneeProbeX Inc.
InventorsGary S. Shaber, Charles W. Buenzli, Jr.
Life of this patent
Estimating the term…
Loading patent…
AssigneeProbeX Inc.
InventorsGary S. Shaber, Charles W. Buenzli, Jr.
Estimating the term…
Apparatus and method for evaluation of a film processor, particularly an x-ray film processor, based on a photodetector signal sequentially indicating the optical density of graded density test areas on a developed film and comparing the output thereof to a preselected voltage relating to the acceptable/too dark threshold of an unexposed or base fog area, the acceptable or too light threshold of a maximum density or dark area and the acceptable/too light and acceptable/too dark threshold of a medium density test area. Sequence testing of the graded density areas is functionally related on a single film strip to timing marks, adapted to be read by photodetector and timing circuitry, the timing marks and graded density test areas being linearly spaced and relatively disposed along the length of film strip.
In a method for determining the status of a photographic film processor said method including the steps of
In an apparatus for determining the status of a processor of photographic film, upon which film a test pattern has been exposed under calibrated conditions to produce, upon development, test areas which include a dark or high density area, an area of middle density, and an unexposed base fog area, said apparatus comprising
Dependencies are inferred from the claim text.