Spatial period division exposing
AssigneeMassachusetts Institute of Technology
InventorsDale C. Flanders, Henry I. Smith
Life of this patent
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Abstract
Soft carbon-K X-rays (38) expose a PMMA photoresist (31) on an oxide layer (32) of a silicon substrate (33) through a parent mask (30) separated a distance S from the resist by a spacer (34) with the parent mask slits (12, 17) defining a spatial period p to establish an intensity pattern of period p/n at the photomask with S=p.sup.2 /n.lambda., where .lambda. is the wavelength of the incident radiation and .lambda.<p.
Claims8
A method for producing gratings which method includes the steps of,
- exposing a substrate to X-ray radiant energy of wavelength .lambda. through a parent mask having a pattern of slits of period p defined by X-ray absorbing material with sufficient attenuation to produce with the X-ray energy transmitted through said parent mask a sharp image on said substrate,
- and spacing said parent mask from said substrate a distance S substantially equal to p.sup.2 /n.lambda. where .lambda. is the wavelength of said X-radiation and n is an integer greater than one to provide said image with an intensity pattern of period p/n on said substrate.
A method for producing grids which method includes the steps of exposing a substrate to X-ray radiant energy of wavelength .lambda. through a parent mask having a grid pattern of apertures, the widths of which are less than one half of the local spatial period p defined by X-ray absorbing material with sufficient attenuation to produce with the X-ray energy transmitted through said parent mask a sharp image on said substrate, and spacing said parent mask from said substrate a distance S substantially equal to p.sup.2 /n.lambda. where .lambda. is the wavelength of said X-radiation and n is an integer greater than one, to provide said image with an intensity pattern of period p/n on said substrate.
A method of producing a Fresnel zone pattern which method includes the steps of exposing a substrate to radiant energy of wavelength .lambda. through a parent mask having a pattern of Fresnel-zone concentric circular apertures, the widths of which are less than one half of the local spatial period, p, and spacing said parent mask from said substrate a distance S substantially equal to p.sup.2 /n.lambda. where .lambda. is the wavelength of said radiation and n is an integer greater than one, to provide an intensity pattern on said substrate having the form of a Fresnel zone pattern.
A method for producing gratings, grids and Fresnel-zone patterns which method includes the steps of exposing a substrate to radiant energy of wavelength .lambda. through a parent mask having a pattern of apertures in the form of a grating, a grid or a set of Fresnel zones, wherein the thickness of the material between the parent mask apertures is such that radiation passing through it suffers a differential phase shift that is an odd multiple of .pi. radians relative to radiation passing through the apertures.
Dependencies are inferred from the claim text.