Structural life computer
AssigneeLockheed Corporation
InventorsThomas E. Adams, Walter D. Murray, Raymond F. Woolf
Life of this patent
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Abstract
This is an electronic device which determines the fatigue life of a structure and its crack growth characteristics when subjected to repeated loading by using the signal from an electrical resistance type strain gage secured to the structure to provide the input to a processor which monitors cyclic excursions, calculates the fatigue and fracture structural damage from those excursions, stores the cumulative damage, and displays that damage on command.
Claims9
A structural life computer to receive electrical signals from a sensor located on a structure under cyclic loads which signals have been converted to digital signals corresponding to maximum and minimum values of stress changes in said structure, and to calculate the structural damage to said structure as indicated by said stress changes, said computer comprising:
- a processor operatively connected to said sensor to receive said digital signals:
- a cycle determinant operatively connected to said processor to separate said digital signals into discrete peak values corresponding to each stress change and return said peak values to said processor;
- a damage calculator operatively connected to said processor to receive said peak values and compute the analytical structure damage value by comparing said discrete peak values with pre-established peak values determined experimentally and return said structural damage value to said processor;
- a damage storage operatively connected to said damage calculator and to said processor to receive and accumulate the damage value computed as aforesaid and return said accumulated damage value to said processor;
- and
- a display operatively connected to said processor to indicate said accumulated damage value.
Dependencies are inferred from the claim text.