Self-limiting erasable memory cell with triple level polysilicon
AssigneeTexas Instruments Incorporated
InventorsDaniel C. Guterman, Te-Long Chiu
Life of this patent
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Abstract
A non-volatile semiconductor memory device of the electrically erasable type employs a floating gate which is programmed by application to high voltage across the source and drain so that hot electrons traverse the gate oxide. The floating gate is discharged by electron tunneling through an erase window which is separated from the control gate. Very small cell size is provided by a triple level polysilicon structure.
Claims15
An electrically erasable insulated gate field effect transistor memory device comprising source and drain regions defined in a face of a body of semiconductor material, a floating gate on said face between the source and drain regions insulated from the semiconductor material by a gate insulator, a control gate overlying part of the floating gate and insulated therefrom by an interlevel insulator, conductive means overlying said face and insulated therefrom by an insulating layer with a portion of the conductive means overlying a segment of the floating gate, said segment being laterally spaced on said face from said part and from the control gate, the conductive means partially overlying the control gate, an insulating coating on said segment separating the portion of the conductive means from said segment but permitting the floating gate to discharge electrons into the conductive means upon application of high voltage thereto.
A method of making an electrically erasable floating gate field effect transistor memory cell comprising the steps of:
- depositing a first layer of conductive material on a face of a silicon body to provide a floating gate which is over a channel region of said face between source and drain areas of said field effect transistor, and to provide an erase window laterally spaced from said channel region,
- depositing a second layer of conductive material on said face overlying said floating gate but insulated therefrom by a first insulator coating to provide a control gate, the control gate not overlying said erase window,
- depositing a third layer of conductive material on said face partially overlying the second layer and overlying said erase window but insulated therefrom by a second insulator coating, the second insulator coating differing from the first insulator coating by enhanced erase current through the second insulator coating relative to that through the first insulator coating.
A semiconductor device comprising first and second regions defined in a face of a body of semiconductor material, a first gate on said face between the first and second regions insulated from the semiconductor material by a gate insulator, a second gate overlying part of the first gate insulated therefrom by an interlevel insulator, a segment of the first gate laterally spaced from said second, conductive means on said face partially overlying said first gate and insulated therefrom by an insulating layer with a portion of the conductive means laterally spaced from said first gate overlying said segment of the first gate, an insulating coating on said segment separating the portion of the conductive means from said segment but permitting the first gate to discharge electrons into the conductive means.
A method of making a semiconductor device comprising the steps of:
- depositing a first layer of conductive material on a face of a semiconductor body to provide a first gate which is over a channel region of said face between first and second regions of said device, and to provide a window area laterally spaced on said face from said channel region,
- depositing a second layer of conductive material on said face overlying said first gate but insulated therefrom by a first insulator coating to provide a second gate,
- depositing a third layer of conductive material on said face partially overlying said second layer and overlying said window area but insulated therefrom by a second insulator coating, the second insulator coating differing from the first insulator coating.
Dependencies are inferred from the claim text.