Contour and width gauge for paneled containers
AssigneeOwens-Illinois, Inc.
InventorGerald F. Scherf
Life of this patent
Estimating the term…
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AssigneeOwens-Illinois, Inc.
InventorGerald F. Scherf
Estimating the term…
Method and apparatus for detecting bulged and sunken sidewalls and incorrect widths on paneled containers. Containers to be inspected are moved along a conveyor. Two groups of three LVDT's (generally opposite from one another) are utilized to measure the distance between each of three points on the container sidewall and a reference line. The measurements are fed to a circuit which determines the deviation of one of the three points from a line passing through the remaining two points. The amount of deviation is utilized to determine whether or not the sidewall is bulged or sunken. Measurements from each pair of opposing LVDT's are fed to a circuit which determines the width of the container at three different heights. The width values are compared to predetermined limits in order to determine if the container width is acceptable. The timing of measurements is controlled by the use of photocell sensors, which detect the passage of a container past particular reference points. The positions of the sensors are adjustable in order to permit different types or sizes of containers to be inspected. In addition, a sensor can be employed to permit accurate width measurements to be made on container with bowed panels.
Apparatus for inspecting the contour of paneled containers, comprising:
Apparatus for inspecting the contour of paneled containers, comprising:
A method for inspecting the contour of paneled upright containers comprising the steps of:
A method for inspecting the contour of paneled containers, comprising the steps of:
Apparatus for inspecting the width of containers comprising:
Dependencies are inferred from the claim text.