Optical calibration apparatus and procedure
AssigneeHumphrey Instruments, Inc.
InventorWilliam E. Humphrey
Life of this patent
Estimating the term…
Loading patent…
AssigneeHumphrey Instruments, Inc.
InventorWilliam E. Humphrey
Estimating the term…
A process and apparatus for the calibration of an optical instrument. An optical instrument--such as a lens meter or ophthalmometer--is provided with a light source, a light detector, and an optical train of assembled optical elements therebetween. A suspect optical element to be measured is placed within the optical train at a measuring interval to deflect light passing along the optical train. An occulting moving boundary locus having at least two boundaries of differing shape, and a dedicated computer may be used to measure beam deflection. The dedicated computer also makes use of stored computer constants to transform raw measurements into the desired optical properties of the suspect optical element. The optical train of the instrument has its assembled optical elements randomly placed to production tolerances; precision registration of the optical elements to traditional close optical tolerances is omitted. Calibration occurs by manipulating the instrument's beam deflection apparatus under the control of a calibration program, by providing the optical instrument being calibrated with an umbilical cord which bypasses the central processing unit of the dedicated computer, but otherwise manipulates the entire optical instrument's beam deflection apparatus. This umbilical cord leads from a calibration computer, which substitutes central processing and contained memory as well as providing a supplemental program for the generation of customized computer constants. Customized computer constants are generated for each instrument by insertion of a series of test elements of known quantity into the samping interval of that instrument, and burned into a memory which is then placed into the dedicated computer of the instrument being calibrated.
A process for assembling and calibrating an instrument which measures optical parameters of a suspect optical system placed within a sampling interval, the instrument having its own optical train of assembled optical elements including a light source, a detector, and means for measuring deflection of light between the light source and the detector caused by the suspect optical system, the instrument also having a dedicated computer for converting the measured deflections into a desired form of optical parameters of the suspect optical system, the dedicated computer having a CPU, the dedicated computer further making use of a plurality of constants stored in a memory unit, the assembly and calibration process comprising the steps of:
A process for calibrating an instrument which measures optical parameters of a suspect optical system placed within a sampling interval, the instrument having its own optical train of optical elements which have been assembled to loose production tolerances, the train including a light source, a detector, and means for generating raw data representative of deflection of light between the light source and the detector caused by the suspect optical system, the instrument also having a dedicated computer for converting the deflection data into a desired form of optical parameters of the suspect optical system, the dedicated computer having a CPU, the dedicated computer further making use of a plurality of constants stored in a memory unit, the calibration process comprising the steps of:
A process for assembling and calibrating an instrument which measures optical parameters of a suspect optical system placed within a sampling interval, the instrument having its own optical train of assembled optical elements including a light source, a detector, and means for measuring deflection of light between the light source and the detector caused by the suspect optical system, the instrument also having a dedicated computer for converting the measured deflections into a desired form of optical parameters of the suspect optical system, the dedicated computer having a CPU, the dedicated computer further making use of a plurality of constants stored in a memory unit, the assembly and calibration process comprising the steps of:
A process for calibrating an instrument which measures optical parameters of a subject optical system placed within a sampling interval, the instrument having its own optical train of optical elements which have been assembled to loose production tolerances, the train including a light source, a detector, and means for generating raw data representative of deflection of light between the light source and the detector caused by the subject optical system, the instrument also having a dedicated computer for converting the deflection data into a desired form of optical parameters of the suspect optical system, the dedicated computer having a CPU, the dedicated computer further making use of a plurality of constants stored in a memory unit, the calibration process comprising the steps of:
Apparatus for calibrating an instrument which measures optical parameters of a suspect optical system placed within a sampling interval, the instrument having a light source, a detector, and means for generating raw data representative of deflections of the light from the light source to the detector caused by the suspect optical system, the instrument having its own optical train of elements assembled to loose production tolerances, the instrument also having a dedicated computer for converting the deflection data into a desired form of optical parameters of the suspect optical system, the dedicated computer making use of a plurality of constants stored in a memory, the calibration apparatus comprising:
A process for calibrating an instrument which measures optical parameters of a suspect optical system placed within a sampling interval, the instrument having its own optical train of optical elements which has been assembled to loose production tolerances, the train including a light source, a detector, and means for generating raw data representative of the deflection of light between the light source and the detector caused by the suspect optical system, the instrument also having a dedicated computer for converting the deflection data into a desired form of optical parameters of the suspect optical system, the dedicated computer having a CPU, the dedicated computer further making use of a plurality of constants stored in a memory unit in order to perform the conversion from deflection data to optical parameters, the calibration process comprising the steps of:
Dependencies are inferred from the claim text.