Crossover structure for microelectronic circuits
AssigneeBell Telephone Laboratories, Incorporated
InventorsRobert W. Berry, David Feldman, Arnold Pfahnl
Life of this patent
Estimating the term…
Abstract
Disclosed is a crossover structure and method of fabricating such structure which contributes low capacitance to the circuit performance. The crossover utilizes a dielectric material which includes spheres of an insulating material in order to separate the conductors. In one aspect of the invention, a UV curable epoxy including hollow glass spheres is deposited on the crosspoint areas and the crossover connector deposited thereon. In another aspect of the invention, the crossover is formed with an air gap and the gap is subsequently filled with an encapsulating material including the spheres.
Claims4
In a micro-electronic circuit including circuit elements and conductors formed on an insulating substrate, a crossover structure comprising:
- first and second conductors formed on the substrate and a third conductor formed on the substrate between said first and second conductors;
- a dielectric material formed over said third conductor in the area between said first and second conductors, said dielectric including an ultraviolet curable epoxy and at least 50 percent by volume of a plurality of hollow spheres with diameters in the range 2-44 .mu.m comprising a material selected from the group consisting of glass and silica, said material having a coefficient of expansion no greater than 50.times.10.sup.-6 per degrees C.;
- and
- a crossover beam contacting said first and second conductors, said beam adhering to and supported by said dielectric.
In a micro-electronic circuit including circuit elements and conductors formed on an insulating substrate, a crossover structure comprising:
- first and second conductors formed on the substrate and a third conductor formed on the substrate between said first and second conductors;
- a crossover beam extending over said third conductor and contacting said first and second conductors;
- and
- a dielectric encapsulating material formed over said circuit and included in the area under said crossover beam, said material comprising a room temperature vulcanizing silicone rubber and 5-55% by volume of a plurality of hollow spheres with diameters in the range 2-44 .mu.m comprising a material selected from the group consisting of glass and silica, said material having a thermal coefficient of expansion of no greater than approximately 24 .times. 10.sup.-6 per degrees C.
Dependencies are inferred from the claim text.