Two-phase CCD regenerator - I/O circuits
AssigneeTexas Instruments Incorporated
InventorsRobert Charles Frye, Alan Harry Katz, Charles Robert Hewes
Life of this patent
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AssigneeTexas Instruments Incorporated
InventorsRobert Charles Frye, Alan Harry Katz, Charles Robert Hewes
Estimating the term…
Insulated gate field effect transistor charge regenerator amplifiers respectively cross-couple the output regions of a pair of two-phase CCD structures with the input regions of those structures. Each amplifier senses the level of binary data charge packets from the output region of one of the shift register structures and in response thereto applies a regenerated and inverted binary data charge packet to the input region of the other shift register structure. One of the amplifiers includes logic gating for inputting and outputting data into and from the shift register structure. A charge regenerator for a two-phase CCD structure comprising first and second shift registers. The charge regenerator comprises a source follower amplifier including a driver transistor, a load transistor and a positive feedback transistor connected between the gate and source of the driver transistor. The gate of the driver transistor is precharged to a predetermined level prior to sensing of the output region charge level and the regenerator inserts into the input region a charge packet corresponding to the data level sensed at the output region, without inversion.
In a charge coupled device memory including a pair of charge coupled device shift register structures each having a data input region and a data output region, and phased clock pulse means coupled to said shift register structures for shifting binary data charge packets in said shift register structures;
A charge coupled device memory including a first charge coupled device shift register structure having an output region and a second charge coupled device shift register structure having an input region, phased clock pulse means coupled to said shift register structures for shifting charge in said shift register structures;
A charge coupled device memory including at least first and second charge coupled device shift register structures each having an output region and an input region, phased clock pulse means coupled to said shift register structures for shifting charge in said shift register structures;
A charge regenerator circuit for a charge coupled device structure including a charge coupled device data output region and a charge coupled device data input region, comprising amplifier means for sensing a charge level at said output region representing a digital 1 data level or a digital 0 data level and controllable by said sensed charge level for inserting into said input region a predetermined amount of charge respectively corresponding to said digital 1 data level or to said digital 0 data level without inversion, said amplifier means including a source follower insulated gate field effect transistor amplifier comprising a driver transistor, a depletion mode load transistor, and positive feedback means including an insulated gate field effect transistor having a channel connected between the gate and source of said driver transistor.
A charge regenerator circuit for a charge coupled device structure including a charge coupled device data output region and a charge coupled device data input region, comprising amplifier means for sensing a charge level at said output region representing a digital 1 data level or a digital 0 data level and controllable by said sensed charge level for inserting into said input region a predetermined amount of charge respectively corresponding to said digital 1 data level or to said digital 0 data level without inversion, and means for precharging the input and output of said amplifier means to a predetermined potential prior to sensing said charge level at said output region.
Dependencies are inferred from the claim text.