Semiconductor switching devices utilizing nonohmic current paths across P-N junctions
OwnerJearld L. Hutsoninventor
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Abstract
The specification discloses semiconductor devices including a semiconductor body having layers of opposite conductivity types to form at least one P-N junction which intersects a face of the semiconductor body. A selected material spans the P-N junction in order to provide a nonohmic current path across the P-N junction, the conductance characteristics of the material being always positive. Electrodes contact the body to form an electrical switching device having improved operating characteristics over a wide temperature range. In the preferred embodiment, the material has a reverse breakdown higher than the forward conduction characteristics of the P-N junction and comprises a Schottky diode.
Claims19
A semiconductor device comprising:
- a semiconductor body having layers of opposite conductivity type to form at least one P-N emitter junction which intersects a face of said body,
- means for providing a nonohmic current path across said P-N junction, all conductance and input admittance characteristics of said means being positive, said means having a reverse breakdown higher than the forward conduction characteristic of said P-N junction and having a forward voltage drop lower than the effective emitter formed by said P-N junction, and
- electrodes contacting said body to form an electrical semiconductor device.
A semiconductor switching device comprising:
- a semiconductor body having at least four alternating layers of opposite conductivity types to form at least three P-N junctions,
- at least one of the interior layers of said body extending to an exterior surface of said body,
- cathode and anode regions connected to opposite exterior surfaces of said body,
- a gate region connected to said one interior layer and formed on the same exterior surface as said cathode region with a P-N junction intersecting said exterior surface between said cathode and gate regions, and
- a Schottky diode having all positive conductance characteristics and formed across said P-N junction with the anode of said diode connected to said gate region and the cathode of said diode connected to said cathode region for providing a nonohmic current path between said one interior layer and one of the exterior layers of said body.
A semiconductor switching device comprising:
- a body of semiconductor material having at least four layers of alternating opposite conductivity type to form at least three P-N junctions,
- one of the interior layers extending through a portion of one of the exterior layers to the exterior surface of said body,
- cathode and anode regions formed on opposite exterior surfaces of said body,
- a gate region formed on said one interior layer extending to the exterior surface of said body and formed on the same exterior surface as said cathode region, and
- material bridging the P-N junction between said one interior layer and said exterior layer for forming a Schottky diode having an anode contacting said gate region and a cathode contacting said cathode region to provide a nonohmic current path across said P-N junction.
A semiconductor switch comprising:
- a body of semiconductor material including at least five layers of alternating opposite conductivity types to form at least four P-N junctions,
- a first anode electrode formed on a first face of said body contacting two adjacent layers,
- a second anode electrode formed on a second face of said body and contacting two different adjacent layers,
- a gate electrode contacting said first face of said body,
- one of said P-N junctions disposed between said first anode electrode and said gate electrode, and
- means for providing a nonohmic current path across said P-N junction, said means having a reverse breakdown higher than the forward conduction characteristic of said P-N junction and further having a forward voltage drop lower than the effective emitter formed by said P-N junction.
A semiconductor switch device having symmetrical bidirectional switching characteristics comprising:
- a body of semiconductor material including five layers of alternating first and second opposite conductivity types to form a plurality of P-N junctions, said body having two outer layers of said first conductivity type,
- a pair of discrete regions of said second conductivity type being formed in one of said outer layers and spaced apart on the exterior surface of said outer layer,
- first isolation means extending through said one of said outer layers and disposed between said regions of said first and second conductivity type in order to electrically isolate said regions from one another,
- first and second electrodes contacting said pair of regions,
- third and fourth electrodes contacting said one outer layer on opposite sides of said first isolation means,
- a discrete region of said second conductivity type formed in the other of said outer layers,
- second isolation means extending through said other of said outer layers and disposed between said region and the exterior surface of said other outer layer,
- a fifth electrode contacting said region in said other outer layer,
- a sixth electrode contacting the exterior surface of said other outer layer on the opposite side of said second isolation means from said region, and
- means for providing a nonohmic current path across interior P-N junctions formed by ones of said five layers.
Dependencies are inferred from the claim text.