Method and system for generating test scenarios using artificial intelligence models
AssigneeSamsung Electronics Co., Ltd.
InventorsKarthik SRINIVASAN, Venkata Subbarao MANNE, Krishna Sumanth VEMURI, Sampathkumar M. BALLARY, Priyadarshini Panemangalore PAI, Manikantha Sasi Kiran MINGI
Life of this patent
Estimating the term…