Particle characterization system
AssigneeUniversite De Geneve
InventorsTakuji ADACHI, Oscar URQUIDI GANDARILLAS
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AssigneeUniversite De Geneve
InventorsTakuji ADACHI, Oscar URQUIDI GANDARILLAS
Estimating the term…
A particle characterization system (2) for measuring at least the size of particles (17) in a liquid or colloidal medium (15), comprising an optical system (3), an optoelectronic detection system (5), and a computing system (6), the optical system (3) comprising an illumination system (8) configured to generate a light beam to illuminate the particles (17), a microscope objective (10) configured to guide the light beam to the particles (17) and collect the scattered light from the particles, a light focusing device (12) configured to focus the scattered light from the sample to the optoelectronic detection system (5), the optoelectronic detection system (5) comprising a photon detector (22) and a data acquisition module (24) connected to the photon detector (22), the optoelectronic detection system configured to time tag photons detected by the photon detector (22) and to transmit the time tagged photon data to the computing system (6), the computing system (6) comprising post-processing software configured to compute particle size distributions using an auto-correlation or cross-correlation computation on a bin group retained in a time window of a selected duration.
A particle characterization system for measuring at least the size of particles in a liquid or colloidal medium, comprising an optical system, an optoelectronic detection system, and a computing system, the optical system comprising an illumination system configured to generate a light beam to illuminate the particles, a microscope objective configured to guide the light beam to the particles and collect the scattered light from the particles, a light focusing device configured to focus the scattered light from the sample to the optoelectronic detection system, the optoelectronic detection system comprising a photon detector and a data acquisition module connected to the photon detector, the optoelectronic detection system configured to time tag photons detected by the photon detector and to transmit the time tagged photon data to the computing system, the computing system comprising post-processing software configured to compute particle size distributions using an auto-correlation or cross-correlation computation on a bin group retained in a time window of a selected duration, said bin group formed of a plurality of bins of said time-tagged photon data, the post-processing software configured to perform a plurality of particle size distribution computations based on different time windows of different durations.
A particle characterization system for measuring at least the size of particles in a liquid or colloidal medium, comprising an optical system, an optoelectronic detection system, and a computing system, the optical system comprising an illumination system configured to generate a light beam to illuminate the particles, a microscope objective configured to guide the light beam to the particles and collect the scattered light from the particles, a light focusing device configured to focus the scattered light from the sample to the optoelectronic detection system, the optoelectronic detection system comprising a photon detector and a data acquisition module connected to the photon detector, the optoelectronic detection system configured to time tag photons detected by the photon detector and to transmit the time tagged photon data to the computing system, the computing system comprising post-processing software configured to compute particle size distributions using an auto-correlation or cross-correlation computation on a bin group (G, G1, . . . Gi) retained in a time window of a selected duration, characterized in that the post-processing software of the computing system comprises a correlation lag time binning module configured to create lag time bins of successively increasing durations to form at least one said bin group (G, G1, . . . Gi).
Dependencies are inferred from the claim text.