Electronic device logistics, grading, clearing, and testing system

1) A system for automated logistics and testing of electronic devices, comprising:

• a system entrance configured to receive electronic devices;
• a dynamic routing table operably coupled to the system entrance and configured to direct electronic devices to one or more processing stations;
• a pre-grade station configured to capture images of the electronic device and assess for major defects;
• a memory wipe station configured to erase data and update system software on the electronic device;
• a cleaning station configured to remove debris and prior labels from the electronic device;
• a labeling station configured to apply a new label to the electronic device;
• a grading station configured to evaluate the condition of the electronic device based on captured images;
• a functional testing station configured to test one or more components of the electronic device, including screen, buttons, speakers, microphones, and cameras;
• an exit preparation station configured to remove a connector dongle from the electronic device;
• and
• an exit station configured to organize and remove the electronic device from the system.