Microsystem Comprising a Flexurally Movable Beam and Multiple Stops

A microsystem, comprising:

• a beam extending from a base to an end, the beam being configured to be flexurally movable within a flexion plane under the effect of a mechanical load, starting from an equilibrium position, the beam extending along a central axis when it occupies the equilibrium position, the beam being configured to cause the base to rotate about an axis of rotation, under the effect of a flexion, by an rotation angle within the flexion plane, the rotation angle being defined relative to the central axis;
• at least one strain gauge configured to deform when the rotation angle increases, the strain gauge being configured to generate a detection signal dependent on the rotation angle;
• wherein the microsystem comprises a first-rank stop and a second-rank stop, each stop being configured to come into contact with the beam;
• wherein:
• the first stop is arranged, along the central axis, between the second-rank stop and the base;
• the first-rank stop extends at a first offset from the equilibrium position, the first-rank stop being configured to come into contact with the beam when the end is displaced from the equilibrium position beyond a first displacement;
• the second-rank stop extends at a second offset, greater than the first offset, from the central axis, relative to the equilibrium position, the second-rank stop being configured to come in contact with the beam when the end is displaced from the equilibrium position by a second displacement, greater than the first displacement;
• so that:
• when the end is displaced from the equilibrium position to the first
• displacement, the rotation angle increases;
• when the end is displaced from the first displacement to the second displacement, the rotation angle decreases under the effect of a deflection of the beam as the beam bears against the first-rank stop.