Device for microwave measurement of a dielectric discontinuity of a material

A microwave measurement apparatus comprising:

• a device for microwave measurement of a dielectric discontinuity of a material to be inspected, said device comprising a launcher for waveguide, a waveguide and a receiving antenna, wherein:
• the launcher is configured to emit in the waveguide a microwave electromagnetic field adapted to interact with the material to be inspected;
• the receiving antenna is configured to receive an electromagnetic field reflected by the material, said reflected electromagnetic field containing information correlated with a dielectric discontinuity of said material;
• the waveguide is configured to:
• propagate the emitted electromagnetic field towards the material;
• convey the reflected electromagnetic field towards the receiving antenna;
• said waveguide having an inspection seat configured for an insertion of at least one portion of the material,
• wherein at least one of either the launcher or the receiving antenna is movable in a plurality of positions around the inspection seat,
• wherein the waveguide has an external seat for insertion of the launcher and an internal seat for insertion of the receiving antenna, or the waveguide has an external seat for insertion of the receiving antenna and an internal seat for insertion of the launcher,
• wherein the external seat is arranged at a peripheral portion of the waveguide and wherein the internal seat is arranged between the external seat and the inspection seat,
• wherein the internal seat has a circumferential extension around the inspection seat and the launcher or the receiving antenna is slidable, inside the internal seat, in rotation around the inspection seat,
• a processing unit configured to:
• process a plurality of values indicating amplitude and phase of the electromagnetic field reflected by the material in a plurality of different relative positions between the material and the receiving antenna;
• generate, as a function of said processing, an image representative of a map of dielectric homogeneity of the material and a signal representative of the presence or absence of a non-integrity of the material.