Specimen analysis method and specimen analyzer
AssigneeSysmex Corporation
InventorsNaoya Kameyama, Tomoyuki Nishida, Yasuhiro Takeuchi, Takayuki Arai, Masahiro Mimura
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AssigneeSysmex Corporation
InventorsNaoya Kameyama, Tomoyuki Nishida, Yasuhiro Takeuchi, Takayuki Arai, Masahiro Mimura
Estimating the term…
Disclosed is a specimen analysis method for analyzing a specimen regarding a plurality of measurement items, the specimen analysis method comprising: measuring a first measurement item and a second measurement item on the basis of a measurement order; executing a process related to a time difference between a measurement of the first measurement item and a measurement of the second measurement item; and obtaining a calculation value from a measurement value of the first measurement item and a measurement value of the second measurement item.
An immunoassay analyzer used for a diagnosis of dementia and configured to measure a target analyte in a specimen, comprising:
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