Apparatus and method for inspecting object
AssigneeSamsung SDI Co., Ltd.
InventorsDmitry Lagunovsky, Ha Hyun CHOI, Sun Uk HWANG
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AssigneeSamsung SDI Co., Ltd.
InventorsDmitry Lagunovsky, Ha Hyun CHOI, Sun Uk HWANG
Estimating the term…
An apparatus and a method for inspecting an object are disclosed. A method of inspecting an object includes, when defects of a battery are inspected using a line scan camera, a plurality of one-dimensional images consecutively generated when an object is scanned in a unit of lines are combined to generate a two-dimensional local image, the generated two-dimensional local image is preprocessed, and then defects of the object are detected based on the preprocessed two-dimensional local image, and a line unit scanning operation of generating a one-dimensional image and a preprocessing operation of a two-dimensional local image are performed in parallel, or concurrently or simultaneously.
An apparatus for inspecting an object, the apparatus comprising:
A method of inspecting an object, the method comprising:
Dependencies are inferred from the claim text.