System and method for flow-through atomic layer deposition on semiconductor processing tool components
AssigneeEntegris, Inc.
InventorCarlo Waldfried
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AssigneeEntegris, Inc.
InventorCarlo Waldfried
Estimating the term…
A system and method for flow-through atomic layer deposition on semiconductor processing tool components are provided. The system comprises a plurality of semiconductor processing tool components, each having a first end, a second end, an inner surface, and an outer surface. An inlet manifold is fluidly connected to the first end of each of the plurality of semiconductor processing tool components. An outlet manifold is fluidly connected to the second end of each of the plurality of semiconductor processing tool components. A heater element encloses each of the plurality of semiconductor processing tool components and controls a target temperature thereof. When a vaporized precursor is flowed through each of the semiconductor processing tool components from the first end to the second end under atomic layer deposition processing conditions, an ALD coating is formed on the inner surface of each of the plurality of semiconductor processing tool components.
A system comprising:
A method for coating an inner surface of a semiconductor processing tool component comprising:
Dependencies are inferred from the claim text.