Polishing composition
OwnerYasuyuki YAMATO, Shota SUZUKIinventors
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OwnerYasuyuki YAMATO, Shota SUZUKIinventors
Estimating the term…
A technical problem to be solved is to provide a novel polishing composition that ensures the polishing removal rate for a film having silicon-silicon bonds such as polysilicon at or above a certain level, increases the ratio of the polishing removal rate for the film having silicon-silicon bonds such as polysilicon to the polishing removal rate for an insulating film such as a film having oxygen-silicon bonds being a function as a stopper layer, and at the same time, can suppress the above-described micro-scratches. A polishing composition comprising: colloidal silica having the number of silanol groups of more than 2 groups/nm2 and less than 6 groups/nm2; a nitrogen-containing basic compound; and a liquid carrier, wherein, when a concentration of the colloidal silica is 1.5% by mass, a transmittance when transmitting light having a wavelength of 450 nm is more than 1.10% and less than 100%, and the polishing composition has a pH of 9.0 to 11.5.
A polishing composition comprising:
A polishing composition which consists essentially of colloidal silica having the number of silanol groups of 2 groups/nm2 or more and 6 groups/nm2 or less, a nitrogen-containing basic compound, at least one of a heteroatom-containing vinyl polymer or a cellulose derivative, and a liquid carrier.
A polishing composition which consists essentially of colloidal silica having the number of silanol groups of 2 groups/nm2 or more and 6 groups/nm2 or less, a nitrogen-containing basic compound, at least one of a heteroatom-containing vinyl polymer or a cellulose derivative, a liquid carrier, and an antiseptic agent.
Dependencies are inferred from the claim text.