Multi-channel spectrum analyzer implementing noise features performance for multiple bandwidth capacities

A test device to analyze radio frequency (RF) signals, comprising:

• a front end to receive one or more RF signals and pre-process the received RF signals;
• a mixer to down-convert the pre-processed RF signals;
• a noise performance component to receive one or more down-converted signals from the mixer and to generate one or more down-converted, noise performance-adjusted signals, wherein the noise performance component includes one or more amplifiers and one or more baluns;
• a multi-channel analog-digital converter (ADC) subsystem to receive the down-converted, noise performance-adjusted signals from the mixer and convert to digital output signals, wherein the multi-channel ADC subsystem comprises:
• a plurality of multi-channel ADCs;
• a field programmable gate array (FPGA) to select one or more ADCs among the plurality of ADCs;
• and
• an ADC sample clock to provide a clock signal to the selected one or more ADCs;
• and
• one or more operational subsystems to perform analytical operations on the digital output signals.

A method, comprising:

• receiving one or more down-converted signals from a mixer of a test device;
• converting, by a noise performance component, the one or more down-converted signals from the mixer to one or more down-converted, noise performance-adjusted signals;
• selecting, by a field programmable gate array (FPGA) of the test device, one or more analog-digital converters (ADCs) among a plurality of ADCs;
• and
• converting the one or more down-converted, noise performance-adjusted signals to digital output signals using the one or more ADCs.