In-situ metastability-caused error correction circuit of successive approximation analog-to-digital converter

An in-situ metastability-caused error correction circuit of a successive approximation analog-to-digital converter, characterized in that it comprises:

• a NOR gate and a NAND gate which form an error correction module, and a NOR gate, a trigger and a delay unit which form an error detection module, wherein the logic input ends of the NOR gate and the NAND gate of the error correction module are connected with the output end of a comparator of the analog-to-digital converter to be detected, and the logic output ends of the NOR gate and the NAND gate are respectively output to the NOR gate of the error detection module so as to obtain a judgment signal for judging whether metastability occurs or not;
• the trigger generates an error pre-calibration signal according to the judgment signal and a clock signal of a comparator of the analog-to-digital converter to be tested;
• and the delay unit generates a pair of mutually inverted error correction signals according to the judgment signal and the error pre-calibration signal of the trigger, outputs the error correction signals to the NOR gate and the NAND gate of the error correction module to generate corrected signals, and outputs the corrected signals to the latch.