Measurement apparatus and sorter
AssigneeSatake Corporation
InventorsHideaki ISHIZU, Tomoyuki MIYAMOTO
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AssigneeSatake Corporation
InventorsHideaki ISHIZU, Tomoyuki MIYAMOTO
Estimating the term…
A measurement apparatus for measuring a feature about shape and/or dimension with respect to a whole and/or part of a target includes a conveyance part, an electromagnetic wave irradiation source, a line sensor including a plurality of electromagnetic wave detection elements linearly arranged in a first direction intersecting with a conveyance direction of the target, and configured to detect at least one of a reflected electromagnetic wave emitted from the electromagnetic wave irradiation source and reflected on the target and a transmitted electromagnetic wave emitted from the electromagnetic wave irradiation source and transmitted through the target, a conveyance velocity detection part configured to detect a conveyance velocity in a predetermined direction with respect to the target in transit, and a feature determination part configured to determine the feature of the target based on an image acquired by the line sensor and the conveyance velocity in the predetermined direction.
A measurement apparatus for measuring a feature about shape and/or dimension with respect to a whole and/or part of a target, the measurement apparatus comprising:
Dependencies are inferred from the claim text.