Method of fabricating semiconductor device
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYuan Tsung Tsai, Ying Ming Wang, Wei Shun Huang, Hsien-Chung Huang, Wei Che Tsai, Sung-Hsin Yang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYuan Tsung Tsai, Ying Ming Wang, Wei Shun Huang, Hsien-Chung Huang, Wei Che Tsai, Sung-Hsin Yang
Estimating the term…
A method of fabricating a semiconductor device includes the following steps. A substrate is patterned to form a plurality of active regions. Isolation features are formed alongside the active regions. Dummy gate structures are formed on the active regions and formed on spacer films aside the dummy gate structures. A doping process is performed on the spacer films to reduce a coefficient of thermal expansion (CTE) value of the spacer films. An interlayer dielectric layer is formed on the isolation features and aside the spacer films. The dummy gate structures are replaced with gate structures.
A method of fabricating a semiconductor device, comprising:
A method of fabricating a semiconductor device, comprising:
A method of fabricating a semiconductor device, comprising:
Dependencies are inferred from the claim text.