Method and circuit arrangement for determining a resistance
AssigneeAnalog Devices International Unlimited Company
InventorBernhard Karl-Heinz Dwersteg
Life of this patent
Estimating the term…
Loading patent…
AssigneeAnalog Devices International Unlimited Company
InventorBernhard Karl-Heinz Dwersteg
Estimating the term…
A new method and circuit arrangement for determining a resistance of a first transistor in a drive system for operating a motor. The drive system comprising a plurality of transistors, and each transistor of the plurality of transistors comprising a control terminal, a first channel terminal, and a second channel terminal. The plurality of transistors is switched to operate the motor using an operating current. A test current is applied between the first and second channel terminals of the first transistor during the on-state of each of the plurality of transistors. The test current is a current value. A voltage difference is measured between the first and second channel terminals of the first transistor during the application of the test current. The on-state resistance of the first transistor is determined based on the current value and the measured voltage difference.
A method of determining a resistance of a first transistor in a drive system for operating a motor, the drive system comprising a plurality of transistors, and each transistor of the plurality of transistors comprising a control terminal, a first channel terminal, and a second channel terminal, the method comprising:
Dependencies are inferred from the claim text.