A method for determining the matching of a substrate to an elastic surface wave device comprising a piezoelectric layer, electrodes embedded in the piezoelectric layer and the substrate, the method being implemented by way of a computer system, the method comprising emitting a signal representative of a matching of the substrate to the elastic surface wave device, when:
- an attenuation of an electrode elastic mode in the piezoelectric layer is less than 0.1 dB/λ;
- and
- a ratio between a speed of a volumetric elastic shear mode for the substrate and a fundamental elastic shear mode for the piezoelectric layer is smaller than a predetermined speed ratio having a value equal to 1 or less.