Modulation of X-Ray Beam Intensity
AssigneeLumArray, Inc.
InventorsHenry I. Smith, Timothy A. Savas
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AssigneeLumArray, Inc.
InventorsHenry I. Smith, Timothy A. Savas
Estimating the term…
A maskless x-ray lithography system provided herein includes a source of an input x-ray beam having a wavelength between 1 nm and 20 nm, and employs an x-ray beam intensity modulator including a plurality of x-ray beam intensity modulator elements. Each x-ray beam intensity modulator element has an x-ray-reflective surface oriented with respect to the input x-ray beam at an x-ray beam grazing angle greater than zero degrees and no larger than an extinguishing grazing angle at which reflectivity is substantially zero for the input x-ray beam wavelength and x-ray-reflective surface material. This produces a plurality of modulated output x-ray beams each having an output intensity that is a fraction of the intensity of the input x-ray beam. A plurality of microlenses are provided, with each microlens oriented to focus a modulated output x-ray beam from the x-ray beam intensity modulator, to produce a plurality of focused, intensity-modulated x-ray beams.
A maskless x-ray lithography system comprising:
8. The maskless x-ray lithography system of claim 1 wherein the array of 2 microlenses comprises an array of microlenses selected from Fresnel zone 3 plates, Fresnel lenses, refractive lenses, and metalenses.
9. The maskless x-ray lithography system of claim 1 wherein:
10. The maskless x-ray lithography system of claim 1 wherein:
11. An x-ray beam intensity modulator comprising:
12. The x-ray beam intensity modulator of claim 11 wherein the x-ray-2 reflective surface of each x-ray beam intensity modulator element comprises a 3 material selected from uranium, a uranium alloy, gold, cobalt, and 4 molybdenum.
13. The x-ray beam intensity modulator of claim 11 wherein each x-ray 2 beam intensity modulator element includes an actuation element, selected 3 from piezoelectric actuation elements and electrostatic actuation elements, to 4 orient the x-ray-reflective surface with respect to the input x-ray beam at an x-5 ray beam grazing angle greater than zero degrees and no larger than an 6 extinguishing grazing angle at which reflectivity is substantially zero for the 7 input x-ray beam wavelength and x-ray-reflective surface material, to produce 8 a reflected output x-ray beam having an output intensity that is a fraction of 9 input intensity of the input x-ray beam.
14. The x-ray beam intensity modulator of claim 11 wherein the x-ray-2 reflective surface of each x-ray beam intensity modulator element comprises 3 an x-ray-reflective surface having a vertically undulating surface profile with 4 periodically spaced undulations along an extent of the x-ray-reflective surface, 5 portions of the periodically spaced undulations being oriented with respect to 6 the input x-ray beam at an x-ray beam grazing angle greater than zero 7 degrees and no larger than an extinguishing grazing angle at which reflectivity 8 is substantially zero for the input x-ray beam wavelength and x-ray-reflective 9 surface material, to produce modulated output x-ray beams including at least one of a plurality of zero-order x-ray diffraction beams and a plurality of non-zero order x-ray diffraction beams, each modulated output x-ray beam having an output intensity that is a fraction of input intensity of the input x-ray beam.
15. An x-ray beam intensity modulator comprising:
16. The x-ray beam intensity modulator of claim 15 wherein the x-ray-2 reflective surface of each x-ray beam intensity modulator element comprises a 3 material selected from uranium, a uranium alloy, gold, cobalt, and 4 molybdenum.
17. A method for maskless x-ray lithographic patterning of a surface 2 comprising:
18. The method of claim 17 wherein at least two x-ray-reflective surfaces in 2 the plurality of x-ray-reflective surfaces have surface portions that are oriented 3 with respect to the input x-ray beam at x-ray beam grazing angles different 4 than that of other x-ray-reflective surfaces.
19. A method for maskless x-ray lithographic patterning of a surface 2 comprising:
20. A method for maskless x-ray lithographic patterning of a surface 2 comprising:
the source of an input x-ray beam comprises a source of a substantially 3 collimated input x-ray beam having a wavelength centered at 13.5 nm;
the source of an input x-ray beam comprises a source of a substantially 3 collimated input x-ray beam having a wavelength centered at 4.5 nm;
an input port oriented to accept an input x-ray beam having an x-ray 3 beam wavelength between 1 nm and 20 nm;
an input port oriented to accept an input x-ray beam having an x-ray 3 beam wavelength between 1 nm and 20 nm;
providing an input x-ray beam having a wavelength between 1 nm and 4 20 nm;
providing an input x-ray beam having a wavelength centered at 13.5 nm;
providing an input x-ray beam having a wavelength centered at 4.5 nm;
the x-ray-reflective surface of the modulator element comprises a 5 surface of a layer of molybdenum.
the x-ray-reflective surface of the modulator element comprises a 5 surface of a layer selected from uranium and a uranium alloy.
a plurality of x-ray beam intensity modulator elements, each x-ray beam 5 intensity modulator element having an x-ray-reflective surface oriented with 6 respect to the input x-ray beam at an x-ray beam grazing angle greater than 7 zero degrees and no larger than an extinguishing grazing angle at which 8 reflectivity is substantially zero for the input x-ray beam wavelength and x-ray-9 reflective surface material, to produce a plurality of output x-ray beams each having a modulated output intensity that is a fraction of input intensity of an input x-ray beam;
a plurality of x-ray beam intensity modulator elements, each x-ray beam 5 intensity modulator element including an x-ray-reflective surface having a 6 vertically undulating surface profile with periodically spaced undulations along 7 an extent of the x-ray-reflective surface, portions of the periodically spaced 8 undulations being oriented with respect to the input x-ray beam at an x-ray 9 beam grazing angle greater than zero degrees and no larger than an extinguishing grazing angle at which reflectivity is substantially zero for the input x-ray beam wavelength and x-ray-reflective surface material, to produce modulated output x-ray beams including at least one of a plurality of zero-order x-ray diffraction beams and a plurality of non-zero order x-ray diffraction beams, each modulated output x-ray beam having an output intensity that is a fraction of input intensity of the input x-ray beam;
directing the input x-ray beam toward a plurality of separated x-ray-5 reflective surfaces, each x-ray reflective surface comprising uranium and 6 oriented with respect to the input x-ray beam at an x-ray beam grazing angle 7 between zero degrees and no more than an extinguishing grazing angle of 13 degrees, at which reflectivity is substantially zero for the input x-ray beam 9 wavelength, to produce a plurality of modulated output x-ray beams each 10 having a modulated output intensity that is a fraction of input intensity of the 11 input x-ray beam;
directing the input x-ray beam toward a plurality of x-ray-reflective 6 surfaces, each x-ray-reflective surface having a vertically undulating surface
directing the input x-ray beam toward a plurality of separated 6 molybdenum surfaces, each molybdenum surface oriented with respect to the 7 input x-ray beam at an x-ray beam grazing angle greater than zero degrees 8 and no larger than an extinguishing angle of 27 degrees, at which reflectivity is 9 substantially zero for the input x-ray beam wavelength, to produce a plurality
profile with periodically spaced undulations along an extent of the x-ray-8 reflective surface;
orienting portions of the periodically spaced undulations with respect to the input x-ray beam at an x-ray beam grazing angle greater than zero degrees and no larger than an extinguishing grazing angle at which reflectivity is substantially zero for the input x-ray beam wavelength and x-ray-reflective surface material, to produce modulated output x-ray beams including at least one of a plurality of zero-order x-ray diffraction beams and a plurality of non-zero order x-ray diffraction beams, each modulated output x-ray beam having an output intensity that is a fraction of input intensity of the input x-ray beam;
of modulated output x-ray beams each having an output intensity that is a 11 fraction of input intensity of the input x-ray beam;
directing the plurality of modulated output x-ray beams to a plurality of 13 microlenses oriented to focus the modulated output x-ray beams onto a 14 surface in a lithographic pattern of intensity-modulated x-ray beams, for 15 forming a lithographic pattern on the surface.
directing the plurality of modulated output x-ray beams to an array of 13 microlenses oriented to focus the modulated output x-ray beams onto a 14 surface in a lithographic pattern of intensity-modulated x-ray beams, for 15 forming a lithographic pattern on the surface.
Dependencies are inferred from the claim text.