Probe for three-dimensional scanner and three-dimensional scanner
AssigneeKeyence Corporation
InventorsYuji MIYAKI, Masayasu IKEBUCHI
Life of this patent
Estimating the term…
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AssigneeKeyence Corporation
InventorsYuji MIYAKI, Masayasu IKEBUCHI
Estimating the term…
Favorable measurement workability is obtained by further enhancing a degree of freedom in handling a probe while enhancing measurement accuracy. A probe for a three-dimensional scanner includes a first marker block and a second marker block that are arrayed side by side in a first direction with a scanner unit positioned at a center, and a third marker block and a fourth marker block that are arrayed side by side in a second direction with the scanner unit positioned at the center. The marker blocks have self-luminous markers facing a plurality of directions, respectively. The fourth marker block is arranged to be separated from a plane defined by the first marker block, the second marker block, and the third marker block.
1-20. (canceled)
A probe for a three-dimensional scanner having a plurality of markers of which images are captured by an imaging unit, the probe comprising:
Dependencies are inferred from the claim text.