Semiconductor device and method of making the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsPo-Yuan Teng, Kuo-Lung Pan, Chih Wang, Wei-Yu Tsai, Hao-Yi Tsai, An-Jhih Su, Yen-Liang Lin
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsPo-Yuan Teng, Kuo-Lung Pan, Chih Wang, Wei-Yu Tsai, Hao-Yi Tsai, An-Jhih Su, Yen-Liang Lin
Estimating the term…
In some embodiments, a method is described that includes forming a first electrically conductive material in first opening of a first masking structure to provide a first conductive line, and forming a second electrically conductive material in second opening of a second masking structure to provide a conductive via. The second masking structure may be removed, and a dielectric layer is formed covering the first conductive line and the conductive via. The method may further include planarizing the dielectric layer to expose an upper surface of the conductive via, and forming an under-bump metallurgy on the planarized surface of the conductive via. The under-bump metallurgy may include an seed layer that covers an interface between the under-bump metallurgy and the conductive via.
A method comprising:
A method comprising:
A device comprising:
Dependencies are inferred from the claim text.