Fin field-effect transistor and method of forming the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYi-Chun Chen, Jih-Jse Lin, Ryan Chia-Jen Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsYi-Chun Chen, Jih-Jse Lin, Ryan Chia-Jen Chen
Estimating the term…
A semiconductor device includes a substrate; a first fin structure extending along a first lateral direction; a second fin structure extending along the first lateral direction; a first gate structure extending along a second lateral direction and straddles the first fin structure; a second gate structure extending along the second lateral direction and straddles the second fin structure. The semiconductor device further includes a dielectric cut structure that separates the first and second gate structures from each other. The dielectric cut structure extends into the substrate and comprises a first portion and a second portion. A width of the first portion along the second lateral direction increases with increasing depth into the substrate and a width of the second portion along the second lateral direction decreases with increasing depth into the substrate. The second portion is located below the first portion.
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.