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US 2026/0225527 A1Published application
Inspection system and inspection method
AssigneeToyota Jidosha Kabushiki Kaisha
InventorsYasuyoshi HATANO, Takuro Sawano
Life of this patent
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Abstract
An inspection system includes an image acquisition unit and an inspection unit. The image acquisition unit acquires an image captured by an imaging device, the image including projected light projected on a projection target from a front lamp provided to a moving object. The inspection unit uses the acquired image to inspect light distribution characteristics of the front lamp.
Claims13
An inspection system comprising:
- an image acquisition unit configured to acquire an image captured by an imaging device, the image comprising projected light projected on a projection target from a front lamp provided to a moving object;
- and
- an inspection unit configured to use the acquired image to inspect light distribution characteristics of the front lamp.
An inspection method comprising the steps of:
- acquiring an image captured by an imaging device, the image comprising projected light projected on a projection target from a front lamp provided to a moving object;
- and
- using the acquired image to inspect light distribution characteristics of the front lamp.
Dependencies are inferred from the claim text.