Mark detection method, distortion amount measurement method, learning method, estimation method, and printing method
AssigneeSCREEN Holdings Co., Ltd.
InventorsYusuke KUBO, Mitsuru YAMBE
Life of this patent
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AssigneeSCREEN Holdings Co., Ltd.
InventorsYusuke KUBO, Mitsuru YAMBE
Estimating the term…
This mark detection method includes a first mark detection step, a detection abnormality determination step, and a second mark detection step to detect a position of a position detection mark on a base material on which a learning image is printed in which a position detection mark is arranged at each of a plurality of mark arrangement positions. In the first mark detection step, a region that meets a first condition is detected as a region to be detected in a photographic image of the base material on which the learning image is printed. In the detection abnormality determination step, the mark arrangement position is compared with the region to be detected to determine a detection abnormality. In the second mark detection step, a region that meets a second condition is detected as a new region to be detected around the mark arrangement position determined as the detection abnormality.
A mark detection method for detecting a position of a position detection mark on a base material on which a learning image is printed in which the position detection mark is arranged at each of a plurality of mark arrangement positions,
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