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US 2026/0211314 A1Published application
Method for removing defect
AssigneeSamsung Electronics Co., Ltd.
InventorsYoonki HWANG, Jeongjae SEO, Sang-Hyeon LEE
Life of this patent
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Abstract
Provided is a method for removing a defect, including loading a target object into a chamber, acquiring information about the defect on the target object, depositing a ferromagnetic material layer on the defect, and removing the defect and the deposited ferromagnetic material layer from the target object.
Claims20
A method for removing a defect, comprising:
- loading a target object into a chamber;
- acquiring information about the defect on the target object;
- depositing a ferromagnetic material layer on the defect;
- and
- removing the defect and the deposited ferromagnetic material layer from the target object.
2 more elements
A method for removing a defect, comprising:
- loading a mask into a chamber;
- acquiring information about the defect on a pattern structure of the mask;
- depositing a ferromagnetic material layer on the defect;
- removing the defect and the deposited ferromagnetic material layer from the mask using a defect transporter, the defect transporter including a defect collecting unit configured to generate a magnetic force;
- and
- moving the defect and the deposited ferromagnetic material layer to a collector.
3 more elements
A method for removing a defect, comprising:
- loading a target object into a chamber;
- acquiring information about a center position of the defect on the target object;
- converting an interior of the chamber into a vacuum state by pumping the interior of the chamber using a vacuum pump connected to the chamber;
- determining a deposition position of a ferromagnetic material layer by applying an offset distance in a horizontal direction from the center position of the defect;
- depositing the ferromagnetic material layer at the determined deposition position within the target object using a beam deposition device;
- removing the defect and the deposited ferromagnetic material layer from the target object using a defect transporter, the defect transporter configured to generate a magnetic force;
- and
- moving the defect and the deposited ferromagnetic material layer to a collector.
5 more elements
Dependencies are inferred from the claim text.