Spectrum measurement system
AssigneeLivestrong Optoelectronics Co., Ltd.
InventorTzu-Huan CHENG
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Abstract
A spectrum measurement system for detecting a sample including a light source of broad wavelength and a spectrometer is disclosed. The light source of broad wavelength is adapted to provide a light with a wide wavelength range to irradiate the sample and generate a reflected light and a transmitted light on the sample. The spectrometer is adapted to receive spectral signals of the reflected light and the transmitted light of the sample at the same time, and directly calculate an absorption spectrum for the sample.
Claims11
A spectrum measurement system for detecting a sample, comprising:
- a light source of broad wavelength, adapted to provide a light with a wide wavelength range to irradiate the sample and generate a reflected light and a transmitted light on the sample;
- and
- a spectrometer adapted to receive spectral signals of the reflected light and the transmitted light of the sample at the same time, and directly calculate an absorption spectrum of the sample.
A spectrum measurement system for measuring a sample, including:
- a light source of broad wavelength adapted to provide light with a wide wavelength range to irradiate the sample and generate a reflected light and a transmitted light on the sample;
- a first focusing optical module adapted to focus the light from the light source or to focus the reflected light;
- a second focusing optical module adapted to focus the transmitted light;
- a first optical switch module adapted to control an opening and closing of transmission of the reflected light;
- a second optical switch module adapted to control an opening and closing of the transmission of the transmitted light;
- and
- a spectrometer adapted to receive and analyze the spectral signal of the reflected light and/or the transmitted light.
Dependencies are inferred from the claim text.