Memory device and reading method thereof
AssigneeMacronix International Co., Ltd.
InventorsWen-Ching Hsiao, Chun-Hsiung Hung, Shuo-Nan Hung
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AssigneeMacronix International Co., Ltd.
InventorsWen-Ching Hsiao, Chun-Hsiung Hung, Shuo-Nan Hung
Estimating the term…
A memory device and a reading method thereof are provided. The memory device is, for example a three dimensional NAND flash memory circuit, and provides a storage media with high-performance and high-capacity. The reading method includes: during a setup period, setting a plurality of word line signals to a set voltage value, wherein each of the word line signals is commonly received by a plurality of memory sub-blocks; during a plurality of reading periods, setting a selected word line signal of the word line signals to a selected voltage value, and setting at least one deselected word line signal of the word line signals to a deselected voltage value; and during each of the reading periods, selecting each of the memory sub-blocks to perform a reading operation, wherein the reading periods are a plurality of consecutive time periods after the setup period.
A reading method, adapted for a memory block having a plurality of memory sub-blocks, comprising:
A memory device, comprising:
Dependencies are inferred from the claim text.