Machine learning-based lag correction for front layer detector in a dual-layer system
AssigneeKoninklijke Philips N.V.
InventorsDirk SCHÄFER, Nikolas David SCHNELLBÄCHER, Walter RUETTEN, Matthias SIMON
Life of this patent
Estimating the term…
Loading patent…
AssigneeKoninklijke Philips N.V.
InventorsDirk SCHÄFER, Nikolas David SCHNELLBÄCHER, Walter RUETTEN, Matthias SIMON
Estimating the term…
System (SYS) and related method for acquisition lag correction in X-ray imaging. The system comprises an input interface (IN) for receiving input including an input image acquired by a front layer detector (FLD) in a multi-energy X-ray imaging apparatus (IA). A corrector component (CC) processes the input image into a corrected version that represents an estimate for image information at lower acquisition lag than the acquisition lag experienced for the input image. Specifically, effects of lag and associated artifacts are removed, and the corrected version is an estimate for the input image in an acquisition setup where there was no such acquisition lag.
System (SYS) for acquisition lag correction in X-ray imaging, comprising:
Computer-implemented method for acquisition lag correction in X-ray imaging, comprising:
Dependencies are inferred from the claim text.