Nanoscale geometrical quantity certified reference material, and preparation method and use thereof
AssigneeNational Institute of Metrology, China
InventorsYushu SHI, Jianqiao LI, Shi LI, Shu ZHANG, Fang WANG
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AssigneeNational Institute of Metrology, China
InventorsYushu SHI, Jianqiao LI, Shi LI, Shu ZHANG, Fang WANG
Estimating the term…
Provided are a nanoscale geometrical quantity certified reference material, and a preparation method and use thereof, belonging to the technical field of nano-scale measurements. The nanoscale geometrical quantity certified reference material includes a substrate and a periodic nanostructured two-dimensional supramolecular film attached to the substrate, where the periodic nanostructured two-dimensional supramolecular film is formed by self-assembly of 5,5′-(9H-fluorene-2,7-diyl)diisophthalic acid and 1,2-bis(4-pyridyl)ethane. Provided is also a preparation method of the nanoscale geometrical quantity certified reference material. The self-assembly is a bottom-up process to prepare a periodic nanostructured two-dimensional supramolecular film.
A nanoscale geometrical quantity certified reference material, comprising a substrate and a periodic nanostructured two-dimensional supramolecular film attached to the substrate,
Dependencies are inferred from the claim text.